Quality Application Notes and PCNs
Document Title / Description | Doc. # | Date |
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AN-305: Discrete-to-Digital Lightning Protection to RTCA/DO-160G, Section 22 Level 3 & 4 This Application Note provides recommended practices for protection against lightning induced transient susceptibility for Holt’s HI-8425, HI-8430 & HI-8435 family of Discrete-to-Digital Devices. This recommended circuit diagram was tested according to RTCA/DO-160G, Section 22 Level 3 & 4 Pin Injection Test Waveform Set A (3 & 4), Set B (3 & 5A), Set Z (3 & 5B). | Rev. D | 3/18/2025 |
AN-303: ARINC 429 Devices Lightning Protection RTCA/DO-160G, Section 22 Level 3 & Level 4 This application note provides customers with a proven lightning protection circuit to achieve Level 3 & 4 pin injection per DO-160 Section 22 for the latest Holt devices. Holt’s recommendations were created to meet the entire range of pin injection waveform sets for DO-160 Section 22 with the smallest footprint possible. | Rev. A | 9/26/2023 |
AN-300: ARINC 429 Lightning Protection, RTCA/DO-160G, Section 22 Level 3 **** NOTE: See AN-303 for lightning level 3 & 4 protection on Holt's latest generation ARINC 429 products. **** The Holt AN-300 Application Note provides a general overview of the effects of lightning on avionics systems in an aircraft along with the recommended protection measures. Included are lightning protection guidelines for Holt’s ARINC 429 line driver and receiver products. | Rev. I | 6/23/2017 |
AN-301: ARINC 429 Lightning Protection, RTCA/DO-160G, Section 22 Level 4 **** NOTE: See AN-303 for lightning level 3 & 4 protection on Holt's latest generation ARINC 429 products. **** This Application Note provides recommended practices for protection against lightning induced transient susceptibility for Holt’s latest generation of ARINC 429 line drivers and receivers. | Rev. E | 6/23/2017 |
AN-304: HI-4850/1/2, RS-485/422 Transceiver Lightning Protection to RTCA/DO-160G, Section 22 Level 3 & 4 This Application Note provides recommended practices for protection against lightning induced transient susceptibility for Holt’s HI-4850/1/2 family of RS-485/422 transceivers. This recommended circuit diagram was tested according to RTCA/DO-160G, Section 22 Level 3 & 4 Pin Injection Test Waveform Set A (3 & 4), Set B (3 & 5A), Set Z (3 & 5B). | Rev. New | 4/19/2012 |
AN-302: ARINC 825 CAN Lightning Protection to RTCA/DO-160G, Section 22 Level 4 This Application Note provides recommended practices for protection against lightning induced transient susceptibility for Holt’s family of ARINC 825 CAN transceivers. This recommended circuit diagram was tested according to RTCA/DO-160G, Section 22 Level 4 Pin Injection Test Waveform Set A (3 & 4), Set B (3 & 5A), Set Z (3 & 5B). | Rev. New | 1/21/2012 |
AN-138: HI-4850, RS-485 Transceiver EMI Qualification RTCA/DO-160G Section 21 The DO-160G compliance test was performed to evaluate the electromagnetic interference of the HI-4850 in its anticipated operating environment in aeronautical applications. The HI-4850 was tested against Section 21, radiated and conducted emissions and category ‘P’, where equipment and associated wiring are located in areas close to high frequency, VHF or GPS radio receiver antennas, or where the aircraft structure provides little shielding. | Rev. New | 1/20/2012 |
AN-136: HI-8592 Single +5V Line Driver EMI Qualification to RTCA/DO-160G Section 21 The HI-8592 is a line driver designed in accordance with the ARINC 429 bus specification. The part includes a voltage doubler, allowing it to operate from a single +5V supply using only two (2) external capacitors. The DO-160G compliance test was performed to evaluate the electromagnetic interference of the HI-8592 in its anticipated operating environment in aeronautical operations. | Rev. New | 5/18/2011 |
AN-135: HI-8596 Single +3.3V Line Driver EMI Qualification to RTCA/DO-160G Section 21 The HI-8596 is a line driver designed in accordance with the ARINC 429 bus specification. The part includes a dual polarity voltage doubler, allowing it to operate from a single +3.3V supply using only four external capacitors. The DO-160G compliance test was performed to evaluate the electromagnetic interference of the HI-8596 in its anticipated operating environment in aeronautical operations. | Rev. New | 5/18/2011 |
Lead-free / RoHS policy In compliance with the RoHS European directives to eliminate lead in the electronics industry, Holt Integrated Circuits has adopted the use of 100% matte tin (Sn) plating for its RoHS compliant plastic packages. | Rev. 3.0 | 8/10/2020 |
CAN Conformance Test Report The CAN Conformance Test Report describes the independent validation of Holt's CAN controller family according to ISO 11898 by C&S group, GmbH. The validation was performed to test specification ISO16845. | Rev. 0.0 | 1/16/2012 |
AN-400: Surface Mount Plastic Packages for High Reliability Applications The AN-400 Application Note provides potential users of plastic encapsulated ICs with an overview of the available technology, guidelines for their use, and a summary of Holt’s rigorous qualification and screening procedures. | Rev. I | 7/6/2011 |
Document Title / Description | Doc. # | Date |
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HI-2130GBxF Solder Ball Size Change The purpose of this notification is to announce that Holt Integrated Circuits has made a solder ball size change to the HI-2130GBxF Family of Product. | v.1.0 | 12/10/2022 |
HI-8429 Die Revision Change The purpose of this notification is to announce that Holt Integrated Circuits has made a die revision change to the HI-8429 Family of Product and that Product Advisory PA-106 no longer applies. | v.1.0 | 3/30/2022 |
HI-6300 DO-254 Artifact Revision Changes The purpose of this notification is to announce that Holt Integrated Circuits has updated the Verilog Test Bench and has consequently made a change to the DO-254 Artifacts which are provided with the HI-6300 Product. There was no change to the IP Core. | v.1.0 | 9/9/2021 |
HI-3210PQTF Die Revision Change The purpose of this notification is to announce that Holt Integrated Circuits has made a Die Revision to the HI-3210PQTF Product. This is a minor design change to improve device performance by preventing a duplicate FIFO read under specific timing conditions. | v.1.0 | 1/8/2021 |
Conversion to NiPdAu Leadframe Finish for QFN Assembly The purpose of this notification is to announce the conversion of external leadframe plating finish on certain ARINC, Discrete to Digital & MIL-STD-1553 family of devices from 100% Matte Tin and SnPb plating to Nickel Palladium Gold (NiPdAu) lead finish. In addition, the die attach and mold compound material has changed. | v.1.0 | 8/21/2020 |
HI-1584 & HI-1585 Family of Products Die Revision & Datasheet Change Holt Integrated Circuits is implementing a design change to improve noise immunity for the Power On Reset circuitry, and improve the ESD performance for the RX inputs. This improvement will result in a die revision change for the HI-1585 die from Revision D to Revision F and datasheet DS1584 Revision D to Revision E and DS1585 Revision E to Revision F. The products will be fully compliant to all published specifications of HI-1584 and HI-1585 datasheet. | v.1.0 | 1/23/2020 |
HI-1584 & HI-1585 Family of Products Die Revision Holt Integrated Circuits is implementing a minor design change to improve the yield for Tail-Off Compensation over temperature. This improvement will result in a die revision change for the HI-1584 die from Revision F to Revision G. There is no change to Fit, Form, Function, Quality or Reliability of these devices. The products will be fully compliant to all published specifications of HI-1584 and HI-1585 datasheet. | v.1.0 | 1/23/2020 |
Die Revision Change to the HI-1590 Family of Products. Holt Integrated Circuits is implementing a minor design change to decrease tail-off for digital control and improve the yield for sinusoid no-response at 500mV over temperature. This improvement will result in a die revision change for the HI-1590 die from Revision C to Revision D. There is no change to Fit, Form, Function, Quality or Reliability of these devices. The products will be fully compliant to all published specifications of HI-1590 datasheet. | v.1.0 | 5/7/2019 |
Addition of NiPdAu Leadframe Finish for QFN Assembly The purpose of this notification is to announce the addition of NidPdAu Leadframe Finish from Greatek Electronics, Taiwan assembly facility for QFN packages for Holt’s ARINC 429 & MIL-STD-1553 family of devices. | v.1.0 | 6/15/2018 |
HI-3585, HI-3586, HI-3587 Die Revision The purpose of this notification is to announce that Holt Integrated Circuits has made a Die Revision Change to the HI-3585, HI-3586, and HI-3587 Family of Products. This minor design change corrects a potential problem with the HI-3585/6/7, which can transmit an unintended ARINC Label 0x00 message (with all zeros) under certain SPI timing conditions. Information on how this condition occurs and workarounds are provided in Holt’s product advisory PA-102 revision New. | v.2.0 | 10/10/2016 |
HI-3585 and HI-3587 Die Revision The purpose of this notification is to announce that Holt Integrated Circuits has made a Die Revision Change to the HI-3585 and HI-3587 Family of Products. The design change improves the robustness of the HI-3585 and HI-3587 ARINC line driver outputs while dynamically transmitting and subjected to transient voltages. | v.1.0 | 1/15/2015 |
HI-8588PSxx-10 Die Revision The purpose of this notification is to announce that Holt Integrated Circuits has made a Die Revision Change to the HI-8588PSxx-10 Product. | v.1.0 | 8/11/2014 |
Addition of SPEL Semiconductor, India for QFN, TSSOP & SOIC Package Assembly The purpose of this notification is to announce the addition of SPEL Semiconductor, India assembly facility for QFN, TSSOP and Small Outline (SOIC) packages for Holt’s ARINC 429, ARINC 825, MIL-STD 1553, and Discrete to Digital family of devices. | v.2.0 | 11/27/2013 |
Assembly Location Addition for Ceramic Side-Brazed DIP Package The purpose of this notice is to describe an addition to the location of assembly of ceramic packages for the ceramic side-brazed DIP package for both ARINC 429 and MIL-STD 1553 family of devices. | v.1.0 | 11/19/2012 |
100mm to 150mm Wafer Conversion for HI-8482 Series of ARINC 429 Products The purpose of this notice is to document the completed conversion of Holt devices manufactured using the 100mm 4.0um CMOS Wafers at Dalsa Semiconductor in Quebec, Canada to Dalsa’s 150mm 4.0um CMOS Wafers within the same fab. | v.1.0 | 9/21/2012 |
HI-3585 & HI-3588 Data Sheet Change The purpose of this notification is to announce that Holt Integrated Circuits has made a Datasheet change to the HI-3585 & HI-3588 Product with regards to SPI Interface Timing at 5.0V and 3.3V. | v.1.0 | 8/24/2012 |
Addition of Greatek Electronic, Taiwan for QFN, TQFP, TSSOP & SOIC Package Assembly The purpose of this notification is to announce the addition of Greatek Electronic, Taiwan assembly facility for QFN, TQFP, TSSOP and Small Outline (SOIC) packages for Holt’s ARINC 429, ARINC 825, MIL-STD 1553, Discrete to Digital, & LCD Display Driver family of devices. | v.1.0 | 1/31/2012 |
MIL-STD-1553 Bus Transceivers Plastic SOIC Package Transfer The purpose of this notification is to describe the changes to the 20 Pin Plastic Small Outline ESOIC-WB packages for the MIL-STD-1553 family of devices. | v.1.0 | 1/20/2012 |
Addition of Millennium Microtech, Thailand for PLCC & SOIC Package Assembly The purpose of this notification is to announce the addition of Millennium Microtech, Thailand assembly facility for Plastic Leaded Chip Carrier (PLCC) and Small Outline (SOIC) packages for Holt’s ARINC 429 and discrete to digital family of devices. | v.1.0 | 1/20/2012 |
44-Lead Quad Flat Pack (QFP) Footprint & Package Change This notice describes the footprint and package changes to the 44 Lead Quad Flat Pack (QFP) Package for all of Holt’s ARINC family of devices. | v.1.0 | 12/1/2011 |
52-Lead Quad Flat Pack (QFP) Package Change & Transfer This notice describes the package changes to the 52 Lead Quad Flat Pack (QFP) Package for all of Holt’s ARINC 429, MIL-STD 1553, and LCD Display Driver family of devices. | v.2.0 | 12/1/2011 |
52 & 44 Lead Quad Flat Pack (QFP) MSL Improvement The purpose of this notification is to announce that Holt Integrated Circuits has made a change to the 52 & 44 Lead Quad Flat Pack (QFP) packages to improve the moisture sensitivity level (MSL) for the ARINC 429, MIL-STD 1553, and LCD Display Driver family of devices. | v.1.0 | 10/1/2010 |
28 Plastic Leaded Chip Carrier (PLCC) Lead Frame, Mold Compound & Die Attach Change The purpose of this notification is to announce that Holt Integrated Circuits has made a change to the 28 J-Lead PLCC Package for the ARINC 429 family of devices. | v.1.0 | 10/1/2010 |
HI-3582A, HI-3583A & HI-3584A Data Sheet Change The purpose of this notification is to announce that Holt Integrated Circuits has made a Datasheet change to the HI-3582A, HI-3583A, & HI-3584A Product. | v.2.0 | 7/19/2010 |
MIL-STD-1553 Bus Transceivers Plastic SOIC Package Change The purpose of this notification is to announce that Holt Integrated Circuits has made a change to the lead standoff for the 20 Pin Plastic Small Outline ESOIC-WB packages assembled at CEI, Thailand. | v.1.0 | 6/22/2010 |
HI-3585 & HI-3588 Data Sheet Change The purpose of this notification is to announce that Holt Integrated Circuits has made a Datasheet change to the HI-3585 & HI-3588 Product which will result in the elimination of Product Advisory PA-100. | v.1.0 | 5/7/2010 |
HI-3185PSx & HI-3185PSx-N ARINC 429 Line Driver Die Change This notice describes the changes to the ARINC 429 Differential Line Driver Die for the HI-3185PSx & HI-3185PSx-N. | v.1.0 | 4/22/2010 |
100-Lead Quad Flat Pack (QFP) Package Transfer 100-Lead Quad Flat Pack (QFP) Package Transfer | v.1.0 | 4/22/2010 |
Die Change for HI-3182PJx & HI-3183PJx ARINC 429 Differential Line Drivers This notice describes the changes to the ARINC 429 Differential Line Driver Die Change for the HI-3182PJx and HI-3183PJx. | v.1.0 | 7/28/2009 |
Die Change for HI-3188PSx ARINC 429 Differential Line Driver This notice describes the changes to the ARINC 429 Differential Line Driver Die Change for the HI-3188PSx. | v.1.0 | 7/28/2009 |
Die Change for HI-3182PSx & HI-3183PSx ARINC 429 Differential Line Drivers This notice describes the changes to the ARINC 429 Differential Line Driver Die Change for the HI-3182PSx & HI-3183PSx. | v.1.0 | 7/28/2009 |
HI-6110 Die Revision and Data Sheet Change The purpose of this notification is to announce that Holt Integrated Circuits has made a Die Revision Change to the HI-6110 Product which will result in a change to its data sheet. | v.1.0 | 12/12/2008 |
Addition of Criteria Labs in Austin, Texas as a qualified ceramic package assembly supplier. The purpose of this notice is to announce the addition of Criteria Labs in Austin, Texas as a qualified assembly supplier for ceramic side-brazed DIP package for both ARINC 429 and MIL-STD 1553 family of devices. | v.1.0 | 12/2/2008 |
Wafer Fab Process Transfer for HI-8382/8383 & HI-8588/8588-10 Series of ARINC 429 Products The purpose of this notice is to announce the completed transfer of the Holt devices manufactured using the 100mm 4.0um CMOS Wafer Process at Dalsa Semiconductor in Quebec, Canada to Dalsa’s 150mm 4.0um CMOS Wafer Process within the same fab. | v.1.0 | 12/2/2008 |
Die Change for HI-3186PSx ARINC 429 Differential Line Driver This notice describes the changes to the ARINC 429 Differential Line Driver Die Change for the HI-3186PSx. | v.1.0 | 12/2/2008 |
3182PSx-N ARINC 429 Differential Line Driver Change for The purpose of this notice is to describe the changes to the ARINC 429 Differential Line Driver Die Change for the 3182PSx-N. | v.1.0 | 11/12/2008 |
52-Lead Quad Flat Pack (QFP) Package Transfer The purpose of this notice is to describe the changes to the 52-Lead Quad Flat Pack (QFP) Package for the ARINC 429, MIL-STD 1553, and LCD Display Driver family of devices. | v.1.0 | 9/12/2008 |
Assembly Location and Mold Compound Change for QFN Packages The purpose of this notice is to describe the changes to the QFN packages for the ARINC 429 and MIL-STD 1553 family of devices. | v.1.0 | 9/12/2008 |
32 & 64-Lead Quad Flat Pack (QFP) Package Transfer The purpose of this notice is to describe the changes to the 32-Lead & 64-Lead Quad Flat Pack (QFP) Package for the ARINC 429, MIL-STD 1553, Discrete to Digital and LCD Display Driver family of devices. | v.1.0 | 9/12/2008 |
44L PLCC Package and DAP Size Standardization The purpose of this notification is to announce that Holt Integrated Circuits has standardized the Die Attach Pad (DAP) size configuration for all products which previously used the 300 mil x 300 mil DAP 44L PLCC Package. | v.1.0 | 6/30/2008 |
44L TQFP (PTQS) Package Lead Formation The purpose of this notification is to announce a change to the 44L TQFP (PTQS) package lead formation. | v.1.0 | 5/28/2008 |
HI-6110 Die Revision and Data Sheet Change The purpose of this notification is to announce that Holt Integrated Circuits has made a Die Revision Change to the HI-6110 Product which will result in a change to its data sheet. | v.1.0 | 5/14/2008 |
Marking and Data Sheet Change for HI-3585 Series of ARINC 429 SPI Interface Products The purpose of this notification is to announce that Holt Integrated Circuits has standardized the naming and top side marking convention for the 3585 series of ARINC 429 SPI interface products and released the final production version of their respective data sheets. | v.1.0 | 5/14/2008 |
44-Pin Plastic QFP Assembly Location Change The purpose of this notice is to describe the changes to the 44-pin plastic QFP packages for the HI-8448PQxx-xx family of ARINC 429 line receiver products. | v.1.0 | 3/6/2008 |
CMOS Display Driver Products Datasheet Change Holt Integrated Circuits is making a change in Datasheet IDD parameter to account for typical manufacturing variability in it's CMOS High Voltage LCD Display Driver Products. | v.1.0 | 12/7/2007 |
ARINC 429 Line Driver Die Change for HI-8585 & HI-8586 Products The purpose of this notification is to document die change to the HI-8585 and HI-8586 ARINC 429 Line Driver products. | v.1.0 | 12/3/2007 |