Quality Application Notes and PCNs

Document Title / DescriptionDoc. #Date
AN-305: Discrete-to-Digital Lightning Protection to RTCA/DO-160G, Section 22 Level 3 & 4
This Application Note provides recommended practices for protection against lightning induced transient susceptibility for Holt’s HI-8425, HI-8430 & HI-8435 family of Discrete-to-Digital Devices. This recommended circuit diagram was tested according to RTCA/DO-160G, Section 22 Level 3 & 4 Pin Injection Test Waveform Set A (3 & 4), Set B (3 & 5A), Set Z (3 & 5B).
Rev. D3/18/2025
AN-303: ARINC 429 Devices Lightning Protection RTCA/DO-160G, Section 22 Level 3 & Level 4
This application note provides customers with a proven lightning protection circuit to achieve Level 3 & 4 pin injection per DO-160 Section 22 for the latest Holt devices. Holt’s recommendations were created to meet the entire range of pin injection waveform sets for DO-160 Section 22 with the smallest footprint possible.
Rev. A9/26/2023
AN-300: ARINC 429 Lightning Protection, RTCA/DO-160G, Section 22 Level 3
**** NOTE: See AN-303 for lightning level 3 & 4 protection on Holt's latest generation ARINC 429 products. ****

The Holt AN-300 Application Note provides a general overview of the effects of lightning on avionics systems in an aircraft along with the recommended protection measures. Included are lightning protection guidelines for Holt’s ARINC 429 line driver and receiver products.
Rev. I6/23/2017
AN-301: ARINC 429 Lightning Protection, RTCA/DO-160G, Section 22 Level 4
**** NOTE: See AN-303 for lightning level 3 & 4 protection on Holt's latest generation ARINC 429 products. ****

This Application Note provides recommended practices for protection against lightning induced transient susceptibility for Holt’s latest generation of ARINC 429 line drivers and receivers.
Rev. E6/23/2017
AN-304: HI-4850/1/2, RS-485/422 Transceiver Lightning Protection to RTCA/DO-160G, Section 22 Level 3 & 4
This Application Note provides recommended practices for protection against lightning induced transient susceptibility for Holt’s HI-4850/1/2 family of RS-485/422 transceivers. This recommended circuit diagram was tested according to RTCA/DO-160G, Section 22 Level 3 & 4 Pin Injection Test Waveform Set A (3 & 4), Set B (3 & 5A), Set Z (3 & 5B).
Rev. New4/19/2012
AN-302: ARINC 825 CAN Lightning Protection to RTCA/DO-160G, Section 22 Level 4
This Application Note provides recommended practices for protection against lightning induced transient susceptibility for Holt’s family of ARINC 825 CAN transceivers. This recommended circuit diagram was tested according to RTCA/DO-160G, Section 22 Level 4 Pin Injection Test Waveform Set A (3 & 4), Set B (3 & 5A), Set Z (3 & 5B).
Rev. New1/21/2012
AN-138: HI-4850, RS-485 Transceiver EMI Qualification RTCA/DO-160G Section 21
The DO-160G compliance test was performed to evaluate the electromagnetic interference of the HI-4850 in its anticipated operating environment in aeronautical applications.  The HI-4850 was tested against Section 21, radiated and conducted emissions and category ‘P’, where equipment and associated wiring are located in areas close to high frequency, VHF or GPS radio receiver antennas, or where the aircraft structure provides little shielding.
Rev. New1/20/2012
AN-136: HI-8592 Single +5V Line Driver EMI Qualification to RTCA/DO-160G Section 21
The HI-8592 is a line driver designed in accordance with the ARINC 429 bus specification. The part includes a voltage doubler, allowing it to operate from a single +5V supply using only two (2) external capacitors. The DO-160G compliance test was performed to evaluate the electromagnetic interference of the HI-8592 in its anticipated operating environment in aeronautical operations.
Rev. New5/18/2011
AN-135: HI-8596 Single +3.3V Line Driver EMI Qualification to RTCA/DO-160G Section 21
The HI-8596 is a line driver designed in accordance with the ARINC 429 bus specification. The part includes a dual polarity voltage doubler, allowing it to operate from a single +3.3V supply using only four external capacitors. The DO-160G compliance test was performed to evaluate the electromagnetic interference of the HI-8596 in its anticipated operating environment in aeronautical operations.
Rev. New5/18/2011
Lead-free / RoHS policy
In compliance with the RoHS European directives to eliminate lead in the electronics industry, Holt Integrated Circuits has adopted the use of 100% matte tin (Sn) plating for its RoHS compliant plastic packages.
Rev. 3.08/10/2020
CAN Conformance Test Report
The CAN Conformance Test Report describes the independent validation of Holt's CAN controller family according to ISO 11898 by C&S group, GmbH. The validation was performed to test specification ISO16845.
Rev. 0.01/16/2012
AN-400: Surface Mount Plastic Packages for High Reliability Applications
The AN-400 Application Note provides potential users of plastic encapsulated ICs with an overview of the available technology, guidelines for their use, and a summary of Holt’s rigorous qualification and screening procedures.
Rev. I7/6/2011
Document Title / DescriptionDoc. #Date
HI-2130GBxF Solder Ball Size Change
The purpose of this notification is to announce that Holt Integrated Circuits has made a solder ball size change to the HI-2130GBxF Family of Product.
v.1.012/10/2022
HI-8429 Die Revision Change
The purpose of this notification is to announce that Holt Integrated Circuits has made a die revision change to the HI-8429 Family of Product and that Product Advisory PA-106 no longer applies.
v.1.03/30/2022
HI-6300 DO-254 Artifact Revision Changes
The purpose of this notification is to announce that Holt Integrated Circuits has updated the Verilog Test Bench and has consequently made a change to the DO-254 Artifacts which are provided with the HI-6300 Product. There was no change to the IP Core.
v.1.09/9/2021
HI-3210PQTF Die Revision Change
The purpose of this notification is to announce that Holt Integrated Circuits has made a Die Revision to the HI-3210PQTF Product. This is a minor design change to improve device performance by preventing a duplicate FIFO read under specific timing conditions.
v.1.01/8/2021
Conversion to NiPdAu Leadframe Finish for QFN Assembly
The purpose of this notification is to announce the conversion of external leadframe plating finish on certain ARINC, Discrete to Digital & MIL-STD-1553 family of devices from 100% Matte Tin and SnPb plating to Nickel Palladium Gold (NiPdAu) lead finish. In addition, the die attach and mold compound material has changed.
v.1.08/21/2020
HI-1584 & HI-1585 Family of Products Die Revision & Datasheet Change
Holt Integrated Circuits is implementing a design change to improve noise immunity for the Power On Reset circuitry, and improve the ESD performance for the RX inputs. This improvement will result in a die revision change for the HI-1585 die from Revision D to Revision F and datasheet DS1584 Revision D to Revision E and DS1585 Revision E to Revision F. The products will be fully compliant to all published specifications of HI-1584 and HI-1585 datasheet.
v.1.01/23/2020
HI-1584 & HI-1585 Family of Products Die Revision
Holt Integrated Circuits is implementing a minor design change to improve the yield for Tail-Off Compensation over temperature. This improvement will result in a die revision change for the HI-1584 die from Revision F to Revision G. There is no change to Fit, Form, Function, Quality or Reliability of these devices. The products will be fully compliant to all published specifications of HI-1584 and HI-1585 datasheet.
v.1.01/23/2020
Die Revision Change to the HI-1590 Family of Products.
Holt Integrated Circuits is implementing a minor design change to decrease tail-off for digital control and improve the yield for sinusoid no-response at 500mV over temperature. This improvement will result in a die revision change for the HI-1590 die from Revision C to Revision D. There is no change to Fit, Form, Function, Quality or Reliability of these devices. The products will be fully compliant to all published specifications of HI-1590 datasheet.
v.1.05/7/2019
Addition of NiPdAu Leadframe Finish for QFN Assembly
The purpose of this notification is to announce the addition of NidPdAu Leadframe Finish from Greatek Electronics, Taiwan assembly facility for QFN packages for Holt’s ARINC 429 & MIL-STD-1553 family of devices.
v.1.06/15/2018
HI-3585, HI-3586, HI-3587 Die Revision
The purpose of this notification is to announce that Holt Integrated Circuits has made a Die Revision Change to the HI-3585, HI-3586, and HI-3587 Family of Products. This minor design change corrects a potential problem with the HI-3585/6/7, which can transmit an unintended ARINC Label 0x00 message (with all zeros) under certain SPI timing conditions. Information on how this condition occurs and workarounds are provided in Holt’s product advisory PA-102 revision New.
v.2.010/10/2016
HI-3585 and HI-3587 Die Revision
The purpose of this notification is to announce that Holt Integrated Circuits has made a Die Revision Change to the HI-3585 and HI-3587 Family of Products. The design change improves the robustness of the HI-3585 and HI-3587 ARINC line driver outputs while dynamically transmitting and subjected to transient voltages.
v.1.01/15/2015
HI-8588PSxx-10 Die Revision
The purpose of this notification is to announce that Holt Integrated Circuits has made a Die Revision Change to the HI-8588PSxx-10 Product.
v.1.08/11/2014
Addition of SPEL Semiconductor, India for QFN, TSSOP & SOIC Package Assembly
The purpose of this notification is to announce the addition of SPEL Semiconductor, India assembly facility for QFN, TSSOP and Small Outline (SOIC) packages for Holt’s ARINC 429, ARINC 825, MIL-STD 1553, and Discrete to Digital family of devices.
v.2.011/27/2013
Assembly Location Addition for Ceramic Side-Brazed DIP Package
The purpose of this notice is to describe an addition to the location of assembly of ceramic packages for the ceramic side-brazed DIP package for both ARINC 429 and MIL-STD 1553 family of devices.
v.1.011/19/2012
100mm to 150mm Wafer Conversion for HI-8482 Series of ARINC 429 Products
The purpose of this notice is to document the completed conversion of Holt devices manufactured using the 100mm 4.0um CMOS Wafers at Dalsa Semiconductor in Quebec, Canada to Dalsa’s 150mm 4.0um CMOS Wafers within the same fab.
v.1.09/21/2012
HI-3585 & HI-3588 Data Sheet Change
The purpose of this notification is to announce that Holt Integrated Circuits has made a Datasheet change to the HI-3585 & HI-3588 Product with regards to SPI Interface Timing at 5.0V and 3.3V.
v.1.08/24/2012
Addition of Greatek Electronic, Taiwan for QFN, TQFP, TSSOP & SOIC Package Assembly
The purpose of this notification is to announce the addition of Greatek Electronic, Taiwan assembly facility for QFN, TQFP, TSSOP and Small Outline (SOIC) packages for Holt’s ARINC 429, ARINC 825, MIL-STD 1553, Discrete to Digital, & LCD Display Driver family of devices.
v.1.01/31/2012
MIL-STD-1553 Bus Transceivers Plastic SOIC Package Transfer
The purpose of this notification is to describe the changes to the 20 Pin Plastic Small Outline ESOIC-WB packages for the MIL-STD-1553 family of devices.
v.1.01/20/2012
Addition of Millennium Microtech, Thailand for PLCC & SOIC Package Assembly
The purpose of this notification is to announce the addition of Millennium Microtech, Thailand assembly facility for Plastic Leaded Chip Carrier (PLCC) and Small Outline (SOIC) packages for Holt’s ARINC 429 and discrete to digital family of devices.
v.1.01/20/2012
44-Lead Quad Flat Pack (QFP) Footprint & Package Change
This notice describes the footprint and package changes to the 44 Lead Quad Flat Pack (QFP) Package for all of Holt’s ARINC family of devices.
v.1.012/1/2011
52-Lead Quad Flat Pack (QFP) Package Change & Transfer
This notice describes the package changes to the 52 Lead Quad Flat Pack (QFP) Package for all of Holt’s ARINC 429, MIL-STD 1553, and LCD Display Driver family of devices.
v.2.012/1/2011
52 & 44 Lead Quad Flat Pack (QFP) MSL Improvement
The purpose of this notification is to announce that Holt Integrated Circuits has made a change to the 52 & 44 Lead Quad Flat Pack (QFP) packages to improve the moisture sensitivity level (MSL) for the ARINC 429, MIL-STD 1553, and LCD Display Driver family of devices.
v.1.010/1/2010
28 Plastic Leaded Chip Carrier (PLCC) Lead Frame, Mold Compound & Die Attach Change
The purpose of this notification is to announce that Holt Integrated Circuits has made a change to the 28 J-Lead PLCC Package for the ARINC 429 family of devices.
v.1.010/1/2010
HI-3582A, HI-3583A & HI-3584A Data Sheet Change
The purpose of this notification is to announce that Holt Integrated Circuits has made a Datasheet change to the HI-3582A, HI-3583A, & HI-3584A Product.
v.2.07/19/2010
MIL-STD-1553 Bus Transceivers Plastic SOIC Package Change
The purpose of this notification is to announce that Holt Integrated Circuits has made a change to the lead standoff for the 20 Pin Plastic Small Outline ESOIC-WB packages assembled at CEI, Thailand.
v.1.06/22/2010
HI-3585 & HI-3588 Data Sheet Change
The purpose of this notification is to announce that Holt Integrated Circuits has made a Datasheet change to the HI-3585 & HI-3588 Product which will result in the elimination of Product Advisory PA-100.
v.1.05/7/2010
HI-3185PSx & HI-3185PSx-N ARINC 429 Line Driver Die Change
This notice describes the changes to the ARINC 429 Differential Line Driver Die for the HI-3185PSx & HI-3185PSx-N.
v.1.04/22/2010
100-Lead Quad Flat Pack (QFP) Package Transfer
100-Lead Quad Flat Pack (QFP) Package Transfer
v.1.04/22/2010
Die Change for HI-3182PJx & HI-3183PJx ARINC 429 Differential Line Drivers
This notice describes the changes to the ARINC 429 Differential Line Driver Die Change for the HI-3182PJx and HI-3183PJx.
v.1.07/28/2009
Die Change for HI-3188PSx ARINC 429 Differential Line Driver
This notice describes the changes to the ARINC 429 Differential Line Driver Die Change for the HI-3188PSx.
v.1.07/28/2009
Die Change for HI-3182PSx & HI-3183PSx ARINC 429 Differential Line Drivers
This notice describes the changes to the ARINC 429 Differential Line Driver Die Change for the HI-3182PSx & HI-3183PSx.
v.1.07/28/2009
HI-6110 Die Revision and Data Sheet Change
The purpose of this notification is to announce that Holt Integrated Circuits has made a Die Revision Change to the HI-6110 Product which will result in a change to its data sheet.
v.1.012/12/2008
Addition of Criteria Labs in Austin, Texas as a qualified ceramic package assembly supplier.
The purpose of this notice is to announce the addition of Criteria Labs in Austin, Texas as a qualified assembly supplier for ceramic side-brazed DIP package for both ARINC 429 and MIL-STD 1553 family of devices.
v.1.012/2/2008
Wafer Fab Process Transfer for HI-8382/8383 & HI-8588/8588-10 Series of ARINC 429 Products
The purpose of this notice is to announce the completed transfer of the Holt devices manufactured using the 100mm 4.0um CMOS Wafer Process at Dalsa Semiconductor in Quebec, Canada to Dalsa’s 150mm 4.0um CMOS Wafer Process within the same fab.
v.1.012/2/2008
Die Change for HI-3186PSx ARINC 429 Differential Line Driver
This notice describes the changes to the ARINC 429 Differential Line Driver Die Change for the HI-3186PSx.
v.1.012/2/2008
3182PSx-N ARINC 429 Differential Line Driver Change for
The purpose of this notice is to describe the changes to the ARINC 429 Differential Line Driver Die Change for the 3182PSx-N.
v.1.011/12/2008
52-Lead Quad Flat Pack (QFP) Package Transfer
The purpose of this notice is to describe the changes to the 52-Lead Quad Flat Pack (QFP) Package for the ARINC 429, MIL-STD 1553, and LCD Display Driver family of devices.
v.1.09/12/2008
Assembly Location and Mold Compound Change for QFN Packages
The purpose of this notice is to describe the changes to the QFN packages for the ARINC 429 and MIL-STD 1553 family of devices.
v.1.09/12/2008
32 & 64-Lead Quad Flat Pack (QFP) Package Transfer
The purpose of this notice is to describe the changes to the 32-Lead & 64-Lead Quad Flat Pack (QFP) Package for the ARINC 429, MIL-STD 1553, Discrete to Digital and LCD Display Driver family of devices.
v.1.09/12/2008
44L PLCC Package and DAP Size Standardization
The purpose of this notification is to announce that Holt Integrated Circuits has standardized the Die Attach Pad (DAP) size configuration for all products which previously used the 300 mil x 300 mil DAP 44L PLCC Package.
v.1.06/30/2008
44L TQFP (PTQS) Package Lead Formation
The purpose of this notification is to announce a change to the 44L TQFP (PTQS) package lead formation.
v.1.05/28/2008
HI-6110 Die Revision and Data Sheet Change
The purpose of this notification is to announce that Holt Integrated Circuits has made a Die Revision Change to the HI-6110 Product which will result in a change to its data sheet.
v.1.05/14/2008
Marking and Data Sheet Change for HI-3585 Series of ARINC 429 SPI Interface Products
The purpose of this notification is to announce that Holt Integrated Circuits has standardized the naming and top side marking convention for the 3585 series of ARINC 429 SPI interface products and released the final production version of their respective data sheets.
v.1.05/14/2008
44-Pin Plastic QFP Assembly Location Change
The purpose of this notice is to describe the changes to the 44-pin plastic QFP packages for the HI-8448PQxx-xx family of ARINC 429 line receiver products.
v.1.03/6/2008
CMOS Display Driver Products Datasheet Change
Holt Integrated Circuits is making a change in Datasheet IDD parameter to account for typical manufacturing variability in it's CMOS High Voltage LCD Display Driver Products.
v.1.012/7/2007
ARINC 429 Line Driver Die Change for HI-8585 & HI-8586 Products
The purpose of this notification is to document die change to the HI-8585 and HI-8586 ARINC 429 Line Driver products.
v.1.012/3/2007